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臺(tai)式(shi)電(dian)鏡(jing)SEM是(shi)利用(yong)電(dian)子束(shu)照射樣(yang)品表(biao)(biao)面，通(tong)過與樣(yang)品相(xiang)互作(zuo)用(yong)產(chan)生(sheng)的(de)(de)(de)(de)信(xin)(xin)號來獲取樣(yang)品表(biao)(biao)面形貌(mao)(mao)以及各(ge)種相(xiang)關(guan)信(xin)(xin)息的(de)(de)(de)(de)高分(fen)辨(bian)率(lv)(lv)成像儀器。采用(yong)的(de)(de)(de)(de)是(shi)間斷(duan)電(dian)子束(shu)的(de)(de)(de)(de)方式(shi)。隨著(zhu)電(dian)子束(shu)技(ji)術的(de)(de)(de)(de)不(bu)斷(duan)發展，SEM在分(fen)辨(bian)率(lv)(lv)、顯微(wei)鏡(jing)頭(tou)等(deng)方面都取得了巨(ju)大的(de)(de)(de)(de)突破(po)和進步。臺(tai)式(shi)電(dian)鏡(jing)SEM的(de)(de)(de)(de)應(ying)用(yong)領域：材(cai)(cai)料(liao)科(ke)學：能夠觀察材(cai)(cai)料(liao)的(de)(de)(de)(de)晶(jing)體結(jie)構、表(biao)(biao)面形貌(mao)(mao)、缺陷(xian)等(deng)，對于(yu)材(cai)(cai)料(liao)科(ke)學的(de)(de)(de)(de)研究和開發非常(chang)重要。生(sheng)物(wu)(wu)學和醫學：可以觀察細胞、組織和生(sheng)物(wu)(wu)分(fen)子等(deng)微(wei)觀結(jie)構，有助于(yu)生(sheng)物(wu)(wu)學和醫學領域的(de)(de)(de)(de)研究。納(na)米技(ji)術：在納(na)米材(cai)(cai)料(liao)的(de)(de)(de)(de)研究和制備中發揮了重要作(zuo)用(yong)，例如...

現(xian)代科學(xue)技術的(de)(de)(de)發(fa)展使得我們對微觀世(shi)界有了更深(shen)入(ru)的(de)(de)(de)認識。在(zai)諸多(duo)現(xian)代科學(xue)儀器(qi)中，臺式電(dian)(dian)鏡SEM(ScanningElectronMicroscope)無(wu)疑是一種非常(chang)重要的(de)(de)(de)儀器(qi)。它(ta)以其出色的(de)(de)(de)分辨(bian)率和(he)(he)廣(guang)闊的(de)(de)(de)應(ying)(ying)用領域受(shou)到了廣(guang)泛的(de)(de)(de)關注(zhu)和(he)(he)應(ying)(ying)用。電(dian)(dian)子(zi)束(shu)的(de)(de)(de)發(fa)射和(he)(he)聚焦(jiao)：SEM使用熱陰極電(dian)(dian)子(zi)槍產生電(dian)(dian)子(zi)束(shu)，并通過磁場的(de)(de)(de)引導將電(dian)(dian)子(zi)束(shu)聚焦(jiao)到樣(yang)品(pin)表(biao)面。聚焦(jiao)后的(de)(de)(de)電(dian)(dian)子(zi)束(shu)精細、高能量，能夠在(zai)樣(yang)品(pin)表(biao)面產生豐(feng)富的(de)(de)(de)信號(hao)(hao)。信號(hao)(hao)的(de)(de)(de)收集和(he)(he)檢測：SEM通過電(dian)(dian)子(zi)和(he)(he)樣(yang)品(pin)之間的(de)(de)(de)相互作用產生多(duo)種信號(hao)(hao)，主要包括二次電(dian)(dian)子(zi)、反射電(dian)(dian)子(zi)、X射...

日(ri)本(ben)電(dian)(dian)(dian)子(zi)(zi)(zi)電(dian)(dian)(dian)鏡(jing)是(shi)(shi)(shi)利用電(dian)(dian)(dian)子(zi)(zi)(zi)束(shu)替代光束(shu)的(de)一種高(gao)分辨率(lv)顯微鏡(jing)。它(ta)的(de)原理(li)(li)主要基于電(dian)(dian)(dian)子(zi)(zi)(zi)注射和電(dian)(dian)(dian)子(zi)(zi)(zi)透鏡(jing)的(de)作用。通過調節電(dian)(dian)(dian)子(zi)(zi)(zi)束(shu)的(de)聚焦(jiao)和方向，可以(yi)獲得高(gao)分辨率(lv)和放大倍數(shu)的(de)圖(tu)像。它(ta)在(zai)材料科學、生物學、物理(li)(li)學等領域具有(you)重(zhong)要的(de)應用價(jia)值。日(ri)本(ben)電(dian)(dian)(dian)子(zi)(zi)(zi)電(dian)(dian)(dian)鏡(jing)的(de)常見問題及(ji)解決方法(fa)如下(xia)：1.顯示(shi)(shi)屏黑屏或無顯示(shi)(shi)-檢查(cha)(cha)電(dian)(dian)(dian)源是(shi)(shi)(shi)否(fou)連(lian)(lian)接好(hao)，確保插(cha)頭插(cha)緊。-檢查(cha)(cha)電(dian)(dian)(dian)源開(kai)(kai)關是(shi)(shi)(shi)否(fou)打(da)開(kai)(kai)，確認電(dian)(dian)(dian)源是(shi)(shi)(shi)否(fou)正(zheng)常供電(dian)(dian)(dian)。-檢查(cha)(cha)連(lian)(lian)接線是(shi)(shi)(shi)否(fou)連(lian)(lian)接好(hao)，確認連(lian)(lian)接線是(shi)(shi)(shi)否(fou)損壞。-嘗試(shi)重(zhong)新啟動電(dian)(dian)(dian)子(zi)(zi)(zi)電(dian)(dian)(dian)鏡(jing)，有(you)時候重(zhong)啟可以(yi)恢復正(zheng)常。2.顯示(shi)(shi)屏閃爍或顯像不(bu)清晰-檢查(cha)(cha)信...

日(ri)本(ben)電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)電(dian)(dian)(dian)(dian)鏡(jing)(jing)的(de)(de)(de)(de)原理主要基于電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)注射(she)和(he)電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)透(tou)(tou)鏡(jing)(jing)的(de)(de)(de)(de)作(zuo)用(yong)。利用(yong)電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)來替代光束(shu)，以提高對樣(yang)品的(de)(de)(de)(de)分(fen)辨(bian)率(lv)和(he)放(fang)大倍數(shu)。與光學顯微鏡(jing)(jing)不同(tong)，電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)電(dian)(dian)(dian)(dian)鏡(jing)(jing)使用(yong)的(de)(de)(de)(de)是電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)，而不是光束(shu)。電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)具有較短的(de)(de)(de)(de)波長，可(ke)以同(tong)時(shi)實現較高的(de)(de)(de)(de)分(fen)辨(bian)率(lv)和(he)放(fang)大倍數(shu)。電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)電(dian)(dian)(dian)(dian)鏡(jing)(jing)的(de)(de)(de)(de)核心是電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)槍(qiang)(qiang)和(he)電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)透(tou)(tou)鏡(jing)(jing)。電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)槍(qiang)(qiang)通過加熱陰極產生電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)，并通過電(dian)(dian)(dian)(dian)場加速電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)。電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)進(jin)入樣(yang)品區域后，根據樣(yang)品的(de)(de)(de)(de)性質，一(yi)部(bu)分(fen)電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)會(hui)被散射(she)、反射(she)或(huo)吸(xi)收，而另一(yi)部(bu)分(fen)電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)會(hui)穿透(tou)(tou)樣(yang)品。電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)透(tou)(tou)鏡(jing)(jing)起到控制電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)的(de)(de)(de)(de)作(zuo)用(yong)，它包(bao)括對電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)束(shu)進(jin)行(xing)聚焦和(he)定(ding)向。電(dian)(dian)(dian)(dian)子(zi)(zi)(zi)(zi)(zi)透(tou)(tou)鏡(jing)(jing)通常由磁鐵制成(cheng)...

臺(tai)式(shi)掃(sao)描(miao)電(dian)(dian)子(zi)(zi)(zi)顯微鏡(jing)的(de)(de)原理如下：1.電(dian)(dian)子(zi)(zi)(zi)源：電(dian)(dian)子(zi)(zi)(zi)源通(tong)常采用熱(re)陰極，即(ji)將鎢絲加熱(re)到(dao)高溫，使其發射電(dian)(dian)子(zi)(zi)(zi)，并通(tong)過(guo)加速電(dian)(dian)場使電(dian)(dian)子(zi)(zi)(zi)獲(huo)得足夠(gou)的(de)(de)能量。2.電(dian)(dian)子(zi)(zi)(zi)光學(xue)系統：電(dian)(dian)子(zi)(zi)(zi)束從電(dian)(dian)子(zi)(zi)(zi)源發出后，通(tong)過(guo)一系列的(de)(de)透鏡(jing)系統進行聚(ju)焦和光學(xue)修正，使電(dian)(dian)子(zi)(zi)(zi)束聚(ju)焦在樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)表(biao)面(mian)上(shang)。透鏡(jing)系統由透鏡(jing)和準(zhun)直器組成(cheng)，能夠(gou)控制電(dian)(dian)子(zi)(zi)(zi)束的(de)(de)聚(ju)焦和掃(sao)描(miao)范圍(wei)。3.樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)臺(tai)：樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)臺(tai)是樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)放(fang)置(zhi)的(de)(de)平臺(tai)，樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)放(fang)置(zhi)在樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)臺(tai)上(shang)，通(tong)過(guo)樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)臺(tai)的(de)(de)移動和調整(zheng)，使樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)處于最佳觀察位置(zhi)。樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)臺(tai)還可以通(tong)過(guo)電(dian)(dian)動裝置(zhi)旋轉、傾斜或(huo)移動，以觀察不同角度(du)或(huo)不同位置(zhi)的(de)(de)樣(yang)(yang)(yang)(yang)(yang)品(pin)(pin)(pin)表(biao)面(mian)...

臺式掃(sao)(sao)描電子(zi)(zi)顯微鏡(ScanningElectronMicroscope，SEM)是一(yi)種利用(yong)(yong)電子(zi)(zi)束(shu)掃(sao)(sao)描樣(yang)(yang)(yang)品(pin)(pin)表面(mian)并(bing)檢測所產(chan)生的信號來獲得樣(yang)(yang)(yang)品(pin)(pin)表面(mian)形貌和(he)成分(fen)信息的儀器。它具有高分(fen)辨(bian)率、廣泛的可視場景以(yi)(yi)及能夠觀察(cha)非(fei)導(dao)電樣(yang)(yang)(yang)品(pin)(pin)的優(you)勢，被廣泛應用(yong)(yong)于(yu)物(wu)(wu)理(li)、化學(xue)、材料科學(xue)、生物(wu)(wu)學(xue)等領(ling)域。臺式掃(sao)(sao)描電子(zi)(zi)顯微鏡的操(cao)作使用(yong)(yong)步驟：1.打(da)(da)開主機電源，并(bing)預熱(re)一(yi)段時間，以(yi)(yi)使電子(zi)(zi)槍溫度穩定。2.打(da)(da)開軟件(jian)，設置(zhi)掃(sao)(sao)描參(can)數，如加速電壓、放大(da)倍(bei)數等。3.將待觀察(cha)的樣(yang)(yang)(yang)品(pin)(pin)放置(zhi)于(yu)樣(yang)(yang)(yang)品(pin)(pin)臺上(shang)，并(bing)固定好。4.調整樣(yang)(yang)(yang)品(pin)(pin)臺高度，使樣(yang)(yang)(yang)...

X射(she)(she)線(xian)(xian)衍(yan)射(she)(she)儀XRD由X射(she)(she)線(xian)(xian)源、樣(yang)品(pin)支(zhi)架(jia)、衍(yan)射(she)(she)器(qi)、探測(ce)器(qi)等組成(cheng)。首先(xian)，通(tong)過X射(she)(she)線(xian)(xian)源產生的(de)(de)X射(she)(she)線(xian)(xian)束照射(she)(she)到(dao)樣(yang)品(pin)上。樣(yang)品(pin)中的(de)(de)晶體對X射(she)(she)線(xian)(xian)進(jin)行衍(yan)射(she)(she)，產生衍(yan)射(she)(she)圖(tu)樣(yang)。在衍(yan)射(she)(she)器(qi)的(de)(de)作(zuo)用下，衍(yan)射(she)(she)圖(tu)樣(yang)被分(fen)散成(cheng)不(bu)同入射(she)(she)角(jiao)(jiao)度的(de)(de)X射(she)(she)線(xian)(xian)。探測(ce)器(qi)記錄不(bu)同入射(she)(she)角(jiao)(jiao)度的(de)(de)X射(she)(she)線(xian)(xian)強度，形成(cheng)衍(yan)射(she)(she)譜。其工作(zuo)原理是(shi)(shi)基于布(bu)拉格法則。根據布(bu)拉格法則，晶體對X射(she)(she)線(xian)(xian)的(de)(de)衍(yan)射(she)(she)滿足(zu)2dsinθ=λ，其中d是(shi)(shi)晶格常(chang)數(shu)，θ是(shi)(shi)入射(she)(she)角(jiao)(jiao)，λ是(shi)(shi)X射(she)(she)線(xian)(xian)的(de)(de)波長(chang)(chang)。通(tong)過測(ce)量衍(yan)射(she)(she)角(jiao)(jiao)度θ和已(yi)知的(de)(de)波長(chang)(chang)λ，可以計算出晶格常(chang)數(shu)d。進(jin)一步的(de)(de)計算和分(fen)析可以得(de)到(dao)晶體的(de)(de)結構...